We are excited to share a detailed dataset focusing on single-layer thickness measurement using a THz spectrometer setup. The dataset is now available on Zenodo.
About the Dataset
The dataset presents a method that uses two continuous wave (CW) lasers — one static and one frequency-modulated — combined with Fast Fourier Transform (FFT) analysis to accurately measure the thickness of thin, single-layer materials.
Key features of the approach include:
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Non-destructive and fast measurement technique
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High precision for thicknesses between 60 and 90 micrometers
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Flexibility across materials with slightly different refractive indices (around 2.4–2.5)
The system parameters (such as modulation slope, laser frequencies, and sampling rates) are fully described, along with examples illustrating the method’s effectiveness.
Accurate and non-destructive layer thickness measurements are critical in industries like semiconductor manufacturing, materials research, and quality control. By combining simple laser setups with powerful signal processing, this method offers a reliable solution for many applications.
Access the Dataset
You can view and download the full dataset:
Access the dataset here
