A new scientific article entitled “Low-Index and Thin-Film Material Characterization in the Terahertz Range via Dielectric Waveguide Evanescent-Field Interaction” has been published in the Journal of Applied Physics, Volume 140, Issue 4.
The publication was also invited to contribute to the Special Collection “Terahertz Frontiers: Quantum and Emergent Materials, Nanoscale Phenomena, Devices and Applications.”
The study introduces a dielectric-waveguide-based method for characterizing low-index materials and thin films at terahertz frequencies. By exploiting the interaction between the material under investigation and the waveguide’s evanescent field, the proposed non-contact approach enables sensitive material analysis and supports the development of compact and integrated terahertz technologies.
Congratulations to the authors:
Ashish Kumar, Hosein Rasekhmanesh, Asrin Piroutiniya, Daniel C. Gallego, Daniel Headland, Muhsin Ali, and Guillermo Carpintero.
This research received support from the European Union’s Horizon Europe research and innovation programme through the POLYNICES, SPRINTER and TERA6G projects.
Additional support was provided by the Spanish Ministry of Science, Innovation and Universities, the European Union NextGenerationEU, the Ministry for Digital Transformation and Civil Service, and Rogers Corporation.
The publication represents another important contribution to the advancement of terahertz material characterization and integrated THz technologies.
Read the article here.
